B.TECH. IN ELECTRONICS ENGINEERING (VLSI DESIGN AND TECHNOLOGY)coretheory
VLSI TESTING
ECE 3128
Syllabus
- 01Introduction to testing and testability
- 02Physical Faults and their modeling
- 03Fault collapsing
- 04Fault Simulation
- 05Critical Path Tracing
- 06Testing of combinational circuits
- 07Various types of faults
- 08Functional v/s structural approach to testing
- 09test vector generation for a single stuck-at-fault in combinational logic
- 10Algebraic algorithms
- 11Structural algorithms
- 12Testability Techniques
- 13controllability and observability
- 14ad-hoc and structured approaches to DFT
- 15scan-path testing
- 16Testing of sequential circuits
- 17Test pattern generation for sequential circuits
- 18Exhaustive
- 19Signatures and self test
- 20Testing with random patterns
- 21LFSRs
- 22random test generation and response compression
- 23Signature analysis
- 24Online self test
References
- M. L. Bushnell and V. D. Agrawal, "Essentials of testing for digital, memory and mixed-signal VLSI circuits", Boston: Kluwer Academic Publishers, 2000.
- Abramovici, M. A. Breuer, and A.D. Friedman, "Digital Systems Testing and Testable Design", Piscataway, New Jersey: IEEE Press, 1994.
- Miczo, "Digital Logic Testing and simulation". New York: Harper & Row, 1986.
- P.K. Lala, "Fault Tolerant & Fault Testable hardware Design", BS Publications, 1998
- Stanley L. Hurst, “VLSI Testing: digital and mixed analogue digital techniques” Pub:Inspec/IEE, 1999.
Credits Structure
3Lecture
0Tutorial
0Practical
3Total